Preparation of atom probe tips from (nano)particles in dispersion using (di)electrophoresis and electroplating

Language
en
Document Type
Article
Issue Date
2023-11-03
Issue Date
2024-02-08
Authors
Vorlaufer, Nora
Josten, Jan
Carl, Simon
Göbel, Erik
Søgaard, Alexander
Taccardi, Nicola
Spiecker, Erdmann
Felfer, Peter
Editor
Publisher
John Wiley & Sons, Inc.
Abstract

The behavior of catalytic particles depends on their chemical structure and morphology. To reveal this information, the characterization with atom probe tomography has huge potential. Despite progresses and papers proposing various approaches towards the incorporation of particles inside atom probe tips, no single approach has been broadly applicable to date. In this paper, we introduce a workflow that allowed us to prepare atom probe specimens from Ga particles in suspension in the size range of 50 nm up to 2 μm. By combining dielectrophoresis and electrodeposition in a suitable way, we achieve a near‐tip shape geometry, without a time‐consuming FIB lift‐out. This workflow is a simple and quick method to prepare atom probe tips and allows for a high preparation throughput. Also, not using a lift‐out allowed us to use a cryo‐stage, avoiding melting of the Ga particles, while ensuring a mechanical stable atom probe tip. The specimen prepared by this workflow enable a stable measurement and low fracture rates.

Research Highlights

Enabling cryo‐preparation of (nano)particles for the atom probe.

Characterization of surface and bulk elemental distribution of GaPt model SCALMS.

Abstract

The workflow enables the incorporation of (nano)particles inside atom probe tips. By avoiding a FIB lift‐out, the approach allows for preparation at cryo‐temperatures: The particles are applied to a tungsten support tip via dielectrophoresis. This compound is encapsulated in nickel via electrodeposition: Finally, the atom probe tomography tip is sharpened. image

Journal Title
Microscopy Research and Technique
Volume
87
Issue
3
Citation

Microscopy Research and Technique 87.3 (2023). DOI:10.1002/jemt.24448

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