Determination of the effective refractive index of nanoparticulate ITO layers

Language
en
Document Type
Article
Issue Date
2013-12-04
Issue Year
2013
Authors
Baum, Marcus
Alexeev, Ilya
Latzel, Michael
Christiansen, Silke H.
Schmidt, Michael
Editor
Abstract

Nanoparticles of transparent conducting oxides, such as indium tin oxide, can be used in printing techniques to generate functional layers for various optoelectronic devices. Since these deposition methods do not create fully consolidated films, the optical properties of such layers are expected to be notably different from those of the bulk material and should be characterized on their own. In this work we present a way to measure the effective refractive index of a particulate ITO layer by refraction of light. The obtained data points are used to identify an accurate layer model for spectroscopic ellipsometry. In this way the complex refractive index of the particle layer is determined in a wide spectral range from ultra violet to near infrared.

Journal Title
Optics Express
Volume
21
Issue
19
Citation
Optics Express 21.19 (2013): S. 22754–22761. 04.12.2013 <http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-21-19-22754>
DOI
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